1980s

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  • A. R. Kortan, H. S. Chen, J. M. Parsey and L. C. Kimerling, "Morphology and
    Microstructure of Al-Li-Cu Quasicrystals," Journal of Materials Science, 24 6 (1989).

 

  • C. Kimerling, "Process-Control for Heterogeneous Materials Systems – A
    Universal Challenge," Jom-Journal of the Minerals Metals & Materials Society, 41 4 (1989).

 

  • Katz, B. E. Weir, D. M. Maher, P. M. Thomas, M. Soler, W. C. Dautremontsmith, R. F.
    Karlicek, J. D. Wynn and L. C. Kimerling, "Highly Stable W/P-In0.53Ga0.47As
    Ohmic Contacts Formed by Rapid Thermal-Processing," Appl. Phys. Lett., 55 21 (1989).

 

  • R. C. Farrow, M. T. Asom, K. A. Jackson and L. C. Kimerling, "SEM Study of
    Phase-Transformation in Alpha-Sn Thin-Films," Institute of Physics Conference Series, 100 (1989).

 

  • S. Chen, A. R. Kortan, F. A. Thiel and L. C. Kimerling, "YbBa2Cu3O7 Epitaxial-Films
    Grown by a Ag-Enhanced Liquid Gas Solidification Process," Appl. Phys. Lett., 55 2 (1989).

 

  • T. Asom, A. R. Kortan, L. C. Kimerling and R. C. Farrow, "Structure and Stability Of
    Metastable Alpha-Sn," Applied Physics Letters, 55 14 (1989).

 

  • T. Asom, E. A. Fitzgerald, A. R. Kortan, B. Spear and L. C. Kimerling,
    "Epitaxial-Growth of Metastable SnGe Alloys," Appl. Phys. Lett., 55 6 (1989).

 

  • S. Chen, S. H. Liou, A. R. Kortan and L. C. Kimerling, "Growth Of Epitaxial YbBa2Cu3O7
    Superconductor by Liquid-Gas-Solidification Processing," Appl. Phys. Lett., 53 8 (1988).

 

  • T. Asom, J. M. Parsey, L. C. Kimerling, R. Sauer and F. A. Thiel, "Changes in the
    Electronic-Properties Of Bulk GaAs By Thermal Annealing," Appl. Phys. Lett., 52 18 (1988).

 

  • M. T. Asom, A. R. Kortan, L. C. Kimerling, J. L. Benton and R. Feldman, "MBE Growth of
    Metastable Alpha-Sn on Heterostructures Of GaAs/InSb and GaAs/ZnTe/CdTe," Journal of Electronic Materials, 17 4 (1988).

 

  • R. Sauer, M. Asom, R. People, D. V. Lang, L. C. Kimerling and J. C. Bean, "New
    Photoluminescence Defect at 1.0192 eV in Silicon Molecular-Beam Epitaxy Layers
    Ascribed to Cu," Applied Physics
    Letters, 51 15 (1987).

 

  • L. C. Kimerling, "Materials Characterization as a Technology Driver," Journal of the Electrochemical Society, 134 8B (1987).

 

  • A. Chantre, S. J. Pearton, L. C. Kimerling, K. D. Cummings and W. C. Dautremontsmith,
    "Interaction of Hydrogen and Thermal Donor Defects in Silicon," Appl. Phys. Lett., 50 9 (1987).

 

  • M. T. Asom, J. M. Parsey, L. C. Kimerling, D. C. Joy, R. Sauer and F. A. Thiel,
    "Modification of Electronic-Properties of Bulk GaAs by Thermal
    Annealing," Journal of Electronic Materials, 16 4 (1987).

 

  • M. T. Asom, J. L. Benton, R. Sauer and L. C. Kimerling, "Interstitial Defect Reactions
    in Silicon," Appl. Phys. Lett., 51 4 (1987).

 

  • M. Lee, L. C. Kimerling, B. G. Bagley and W. E. Quinn, "The Optically Detected
    Magnetic-Resonance of Dangling Bonds at the Si/Si/O2 Interface," Solid State Communications, 57 8 (1986).

 

  • A. Chantre and L. C. Kimerling, "Configurationally Multistable Defect in
    Silicon," Appl. Phys. Lett., 48 15 (1986).

 

  • M. Stavola, K. M. Lee, J. C. Nabity, P. E. Freeland and L. C. Kimerling, "Site
    Symmetry and Ground-State Characteristics for the Oxygen Donor in
    Silicon," Physical Review Letters, 54 24 (1985).

 

  • L. C. Kimerling, J. M. Parsey and Metallurgical Society of AIME. Electronic Materials
    Committee., "Proceedings of the 13th International Conference on Defects
    in Semiconductors," Warrendale, Pa., Metallurgical Society of AIME, 1985.

 

  • L. C. Kimerling and J. M. Parsey, "Imperfection in Semiconductor-Materials," Journal of Metals, 37 5 (1985).

 

  • L. C. Kimerling, "Frontiers in the Science of Electronic Materials," Journal of Metals, 37 5 (1985).

 

  • Stavola, M. Levinson, J. L. Benton and L. C. Kimerling, "Extrinsic Self-Trapping and
    Negative U in Semiconductors – A Metastable Center in InP," Physical Review B, 30 2 (1984).

 

  • S. K. Milshtein, D. C. Joy, S. D. Ferris and L. C. Kimerling, "Defect
    Characterization Using SEM-CCM – Relative Contrast Measurements," Physica Status Solidi a-Applied Research,
    84 2 (1984).

 

  • J. L. Benton, M. Levinson, A. T. Macrander, H. Temkin and L. C. Kimerling,
    "Recombination Enhanced Defect Annealing in N-InP," Appl. Phys. Lett., 45 5 (1984).

 

  • M. Stavola, J. R. Patel, L. C. Kimerling and P. E. Freeland, "Diffusivity of Oxygen in
    Silicon at the Donor Formation Temperature," Appl. Phys. Lett., 42 1
    (1983).

 

  • M. Stavola and L. C. Kimerling, "Symmetry Determination for Deep States in
    Semiconductors from Stress-Induced Dichroism of Photocapacitance," Journal of Applied Physics, 54 7 (1983).

 

  • M. Levinson, M. Stavola, J. L. Benton and L. C. Kimerling, "Metastable M-Center In InP
    – Defect-Charge-State Controlled Structural Relaxation," Physical Review B, 28 10 (1983).

 

  • M. Levinson, J. L. Benton and L. C. Kimerling, "Electronically Controlled Metastable
    Defect Reaction in InP," Physical
    Review B, 27 10 (1983).

 

  • L. C. Kimerling and J. L. Benton, "Electronically Controlled Reactions of
    Interstitial Iron in Silicon," Physica
    B & C, 116 1-3 (1983).

 

  • L. C. Kimerling, "Electronic-Structure and Properties – Fradin, Fy," Journal of Testing and Evaluation, 11 3 (1983).

 

  • L. C. Kimerling, "Defects in Semiconductors – 1982," Physica B & C, 116 1-3 (1983).

 

  • W. M. Bullis, L. C. Kimerling and Electrochemical Society. Electronics Division.,
    "Proceedings of the Symposium on Defects in Silicon," Pennington, NJ
    (10 S. Main St., Pennington 08534-2896), Electrochemical Society, 1983.

 

  • J. L. Benton, L. C. Kimerling and M. Stavola, "The Oxygen Related Donor Effect
    in Silicon," Physica B & C, 116 1-3 (1983).

 

  • M. Levinson, J. L. Benton, H. Temkin and L. C. Kimerling, "Defect states in electron
    bombarded n-InP," Applied Physics Letters, 40 11 (1982).

 

  • G. K.Celler, G. L. Miller, J. L. Benton, D. C. Jacobson, L. C. Kimerling, M. D.
    Robinson and D. J. Lischner, "Rapid Thermal Annealing of Ion-Implanted Si
    with Tungsten-Halogen Lamps," Journal of the Electrochemical Society, 129 3 (1982).

 

  • J. L. Benton and L. C. Kimerling, "Capacitance Transient Spectroscopy of Trace
    Contamination in Silicon," Journal of the Electrochemical Society, 129 9 (1982).

 

  • V. Swaminathan, L. C. Kimerling and W. R. Wagner, "The Effect of
    Electron-Irradiation on the Low-Temperature Emission-Spectra from Ge-Doped
    Ga0.60Al0.40As Grown by Liquid-Phase Epitaxy," Appl. Phys. Lett., 38 11 (1981).

 

  • J. R. Patel and L. C. Kimerling, "Dislocation Energy-Levels in Deformed Silicon,"
    Crystal Research and Technology, 16 2 (1981).

 

  • L. C. Kimerling and J. L. Benton, "Oxygen-related donor states in
    silicon," Appl. Phys. Lett., 39 5 (1981).

 

  • L. C. Kimerling and J. L. Benton, "The Electrical-Activity of Oxygen in
    Silicon," Journal of the Electrochemical Society, 127 8 (1980).

 

  • J. L. Benton, C. J. Doherty, S. D. Ferris, D. L. Flamm, L. C. Kimerling and H. J.
    Leamy, "Hydrogen passivation of point defects in silicon," Appl. Phys. Lett., 36 8 (1980).