Xiaoman Duan

EMAT Research Staff

Ph.D., Materials Science and Engineering, BUST/MIT, 1992

      M.S., Beijing University of Science and Technology (BUST), 1987

Dr. Duan  joined EMAT  in 1994 as a postdoctoral associate.  In 1996, she  became a research associate. 

Her current research  focuses on microstructural studies of atomic and extended defects in semiconductors using electron microscopy and diffraction methods.  Her  projects cover Er ion implantation in Si, silicon waveguides, and optical microcavities Si microphotonics.  Her  activities also include the investigation of defects in CMOS and BiCMOS devices.