Ph.D., Physics, Israel Institute of Technology
Dr. Eshed's Ph.D. thesis covered optical spectroscopy for the study of diffusion processes in SiGe layers deposited on non-planar Si substrates. After receiving her degree, she spent two years as a postdoctoral associate investigating SiGe quantum dot structures at the University of Texas at Arlington.
Her main research interests include: SiGe structures for photodetectors, Si based materials processing for microphotonic components, and ultra high vacuum deposition.
